Nanometrics Incorporated (NASDAQ:NANO) Files An 8-K Submission of Matters to a Vote of Security HoldersItem 5.07 – Submission of Matters to a Vote of Security Holders.
On May 22, 2018, Nanometrics Incorporated held its 2018 Annual Meeting of Stockholders (the “Annual Meeting”). The final results of voting for each matter submitted to a vote of the stockholders at the Annual Meeting are as follows:
|
1. |
The stockholders elected J. Thomas Bentley, Edward J. Brown Jr., Robert Deuster, Bruce C. Rhine, Christopher A. Seams, Timothy J. Stultz, Ph.D. and Christine A. Tsingos as directors of Nanometrics, each to serve until the next annual meeting and until his or her respective successor has been duly elected and qualified. The voting for each director was as follows: |
|
Nominee |
For |
Withheld |
Broker Non-Votes |
|
J. Thomas Bentley |
19,262,330 |
66,755 |
2,318,093 |
|
Edward J. Brown, Jr. |
18,997,765 |
331,320 |
2,318,093 |
|
Robert Deuster |
19,286,832 |
42,253 |
2,318,093 |
|
Pierre-Yves Lesaicherre, Ph.D. |
19,274,484 |
54,601 |
2,318,093 |
|
Bruce C. Rhine |
18,967,996 |
361,089 |
2,318,093 |
|
Christopher A. Seams |
19,017,519 |
311,566 |
2,318,093 |
|
Timothy J. Stultz, Ph.D. |
19,047,148 |
281,937 |
2,318,093 |
|
Christine A. Tsingos |
19,288,577 |
40,508 |
2,318,093 |
|
2. |
The stockholders approved, on an advisory (non-binding) basis, the compensation paid to Nanometrics’ executive officers in 2017, as disclosed in Nanometrics’ proxy statement for the Annual Meeting, by the following vote: |
|
Votes For |
Votes Against |
Abstain |
Broker Non-Votes |
|
18,617,578 |
701,731 |
9,776 |
2,318,093 |
|
3. |
The stockholders ratified PricewaterhouseCoopers, LLP as Nanometrics’ independent registered public accounting firm for the fiscal year ending December 29, 2018, by the following vote: |
|
Votes For |
Votes Against |
Abstain |
Broker Non-Votes |
|
21,523,559 |
114,179 |
9,440 |
0 |
About Nanometrics Incorporated (NASDAQ:NANO)
Nanometrics Incorporated (Nanometrics) provides process control metrology and inspection systems used in the fabrication of integrated circuits, high-brightness light emitting diodes (HB-LEDs), discrete components and data storage devices. The Company operates in the segment of sale, design, manufacture, marketing and support of thin film and optical critical dimension systems. The Company’s automated and integrated systems address process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, and analysis of various other film properties, such as optical, electrical and material characteristics. The Company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications.
