MECHANICAL TECHNOLOGY, INCORPORATED (OTCMKTS:MKTY) Files An 8-K Submission of Matters to a Vote of Security HoldersItem 5.07 Submission of Matters to a Vote of Security Holders.
(a-b) Mechanical Technology, Incorporated held its Annual Meeting of Stockholders on June 6, 2018 (the “Annual Meeting”). At the Annual Meeting, the Company’s stockholders:
1. Elected as director Edward R. Hirshfield to hold office until the 2021 Annual Meeting of Stockholders or until his successor is duly elected and qualified;
2. Elected as director William P. Phelan to hold office until the 2021 Annual Meeting of Stockholders or until his successor is duly elected and qualified; and
3. Approved the advisory non-binding vote on executive officer compensation.
At the Annual Meeting, the stockholders voted as follows:
Matter |
Votes For |
Votes Against / Withheld |
Abstentions |
Broker Non-Votes |
1. Election of Edward R. Hirshfield |
4,994,466 |
487,559 |
N/A |
N/A |
2. Election of William P. Phelan |
4,748,907 |
733,118 |
N/A |
N/A |
3. Approval of the advisory non-binding vote on executive officer compensation |
4,697,367 |
492,100 |
292,558 |
N/A |
About MECHANICAL TECHNOLOGY, INCORPORATED (OTCMKTS:MKTY)
Mechanical Technology, Incorporated conducts operations through its subsidiary, MTI Instruments, Inc. (MTI Instruments). MTI Instruments supplies precision linear displacement solutions, vibration measurement and system balancing solutions, and wafer inspection tools. The Company’s product offerings include Accumeasure Series, Microtrak 4, Microtrak PRO-2D, MTI-2100 Fotonic Sensor Series, Accumeasure D Series, Microtrak TGS, PBS-4100+ Portable Balancing System, PBS-4100R+ Test Cell Vibration Analysis & Trim Balancing System, TSC-4800A Tachometer Signal Conditioner and 1510A Calibrator, Accumeasure Digital Series, Accumeasure Analog Series, Semtester Tensile Stages and Proforma 300i, PV 1000. MTI Instruments serves markets that require precise measurements and control of products and processes in automated manufacturing, assembly and operation of machinery, and metrology tools for semiconductor and solar wafer characterization, among others.